Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
The classic Generalized Sequential Patterns (GSP) algorithm returns all frequent sequences present in a database. However, usually a few ones are interesting from a user's po...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Condensed representations of pattern collections have been recognized to be important building blocks of inductive databases, a promising theoretical framework for data mining, and...
Thoughit has been possible in the past to learn to predict DNAhydration patterns from crystallographic data, there is ambiguity in the choice of training data (both in terms of th...
Dawn M. Cohen, Casimir A. Kulikowski, Helen Berman