3791 search results - page 219 / 759 » Packing sets of patterns |
106
Voted
BMCBI
2007
15 years 3 months ago
2007
Background: Hidden Markov Models (HMMs) provide an excellent means for structure identification and feature extraction on stochastic sequential data. An HMM-with-Duration (HMMwD) ...
165
Voted
IJDAR
2002
15 years 3 months ago
2002
Abstract. This paper describes a performance evaluation study in which some efficient classifiers are tested in handwritten digit recognition. The evaluated classifiers include a s...
242
Voted
TON
2010
14 years 10 months ago
2010
While WiFi was initially designed as a local-area access network, mesh networking technologies have led to increasingly expansive deployments of WiFi networks. In urban environment...
116
Voted
VLSID
2003
IEEE
16 years 4 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
111
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...