3791 search results - page 303 / 759 » Packing sets of patterns |
133
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MCS
2001
Springer
15 years 8 months ago
2001
Springer
We provide several enhancements to our previously introduced algorithm for a sequential construction of a hybrid network of radial and perceptron hidden units [6]. At each stage, ...
129
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ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
144
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ISORC
1998
IEEE
15 years 8 months ago
1998
IEEE
Many engineers are still reluctant to adopt advanced object-oriented technologies (such as high modularity, dynamic binding, automatic garbage collection, etc.) for embedded syste...
144
Voted
DATE
1997
IEEE
15 years 8 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
129
Voted
VTS
1996
IEEE
15 years 8 months ago
1996
IEEE
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...