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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
15 years 6 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
APIN
2008
100views more  APIN 2008»
14 years 11 months ago
A case-based approach for characterization and analysis of subgroup patterns
In general, cases capture knowledge and concrete experiences of specific situations. By exploiting case-based knowledge for characterizing a subgroup pattern, additional informati...
Martin Atzmüller, Frank Puppe
ICCAD
2002
IEEE
152views Hardware» more  ICCAD 2002»
15 years 8 months ago
Efficient instruction encoding for automatic instruction set design of configurable ASIPs
Application-specific instructions can significantly improve the performance, energy, and code size of configurable processors. A common approach used in the design of such instruc...
Jong-eun Lee, Kiyoung Choi, Nikil Dutt
KDD
2009
ACM
174views Data Mining» more  KDD 2009»
15 years 6 months ago
Visual exploration of categorical and mixed data sets
For categorical data there does not exist any similarity measure which is as straight forward and general as the numerical distance between numerical items. Due to this it is ofte...
Sara Johansson
PREMI
2011
Springer
14 years 2 months ago
Feature Set Selection for On-Line Signatures Using Selection of Regression Variables
Abstract. In this paper we approach feature set selection phase in signature verification by applying the method for selection of regression variables based on Mallows Cp criterio...
Desislava Boyadzieva, Georgi Gluhchev