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CLEF
2010
Springer
14 years 9 months ago
Overview of ResPubliQA 2010: Question Answering Evaluation over European Legislation
This paper describes the second round of ResPubliQA, a Question Answering (QA) evaluation task over European legislation, a LAB of CLEF 2010. Two tasks have been proposed this year...
Anselmo Peñas, Pamela Forner, Álvaro...
ASPLOS
2006
ACM
15 years 3 months ago
Ultra low-cost defect protection for microprocessor pipelines
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
Smitha Shyam, Kypros Constantinides, Sujay Phadke,...
JSA
2010
173views more  JSA 2010»
14 years 4 months ago
Hardware/software support for adaptive work-stealing in on-chip multiprocessor
During the past few years, embedded digital systems have been requested to provide a huge amount of processing power and functionality. A very likely foreseeable step to pursue th...
Quentin L. Meunier, Frédéric P&eacut...
BMCBI
2010
134views more  BMCBI 2010»
14 years 9 months ago
ScreenMill: A freely available software suite for growth measurement, analysis and visualization of high-throughput screen data
Background: Many high-throughput genomic experiments, such as Synthetic Genetic Array and yeast two-hybrid, use colony growth on solid media as a screen metric. These experiments ...
John C. Dittmar, Robert J. D. Reid, Rodney Rothste...
ICSE
2008
IEEE-ACM
15 years 10 months ago
The effect of the number of inspectors on the defect estimates produced by capture-recapture models
Inspections can be made more cost-effective by using capturerecapture methods to estimate post-inspection defects. Previous capture-recapture studies of inspections used relativel...
Gursimran Singh Walia, Jeffrey C. Carver, Nachiapp...