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» Parameterizations of Test Cover with Bounded Test Sizes
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FOCS
2008
IEEE
15 years 5 months ago
Arithmetic Circuits: A Chasm at Depth Four
We show that proving exponential lower bounds on depth four arithmetic circuits imply exponential lower bounds for unrestricted depth arithmetic circuits. In other words, for expo...
Manindra Agrawal, V. Vinay
JUCS
2007
95views more  JUCS 2007»
14 years 10 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow
ISSTA
2006
ACM
15 years 4 months ago
Test input generation for java containers using state matching
The popularity of object-oriented programming has led to the wide use of container libraries. It is important for the reliability of these containers that they are tested adequate...
Willem Visser, Corina S. Pasareanu, Radek Pel&aacu...
ESE
2006
100views Database» more  ESE 2006»
14 years 10 months ago
An evaluation of combination strategies for test case selection
This paper presents results from a comparative evaluation of five combination strategies. Combination strategies are test case selection methods that combine "interesting&quo...
Mats Grindal, Birgitta Lindström, Jeff Offutt...
FATES
2003
Springer
15 years 3 months ago
Auto-generating Test Sequences Using Model Checkers: A Case Study
Use of model-checking approaches for test generation from requirement models have been proposed by several researchers. These approaches leverage the witness (or counter-example) ...
Mats Per Erik Heimdahl, Sanjai Rayadurgam, Willem ...