We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
We present a technique to improve the efficiency of hardware-software cosimulation, using design information known at simulator compile-time. The generic term for such optimizatio...
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
Many applications require protection of secret or sensitive information, from sensor nodes and embedded applications to large distributed systems. The confidentiality of data can b...