187 search results - page 31 / 38 » Parametric Encryption Hardware Design |
90
Voted
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
VTS
2000
IEEE
15 years 1 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
DATE
2006
IEEE
15 years 1 months ago
2006
IEEE
The clock latency scheduling problem is usually solved on the sequential graph, also called register-to-register graph. In practice, the the extraction of the sequential graph for...
ATVA
2008
Springer
14 years 11 months ago
2008
Springer
e Abstraction Arie Gurfinkel1 , Ou Wei2 , and Marsha Chechik2 1 Software Engineering Institute, Carnegie Mellon University 2 Department of Computer Science, University of Toronto A...