187 search results - page 9 / 38 » Parametric Encryption Hardware Design |
ICCAD
1994
IEEE
15 years 1 months ago
1994
IEEE
? We describe a synthesis system that takes operating range constraints and inter- and intra- circuit parametric manufacturing variations into account while designing a sized and b...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
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ASPDAC
2006
ACM
15 years 1 months ago
2006
ACM
- Technology scaling and sub-wavelength optical lithography is associated with significant process variations. We propose a self-adaptive variable supply-voltage scaling (SAVS) tec...
HOST
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs) used in safety critical, security and military systems. The migration of IC fabrication to low-cost ...
FPGA
2007
ACM
15 years 3 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...