Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the construction of parame...
Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, S...
Abstract-- Many model order reduction methods for parameterized systems need to construct a projection matrix V which requires computing several moment matrices of the parameterize...
A model-constrained adaptive sampling methodology is proposed for reduction of large-scale systems with high-dimensional parametric input spaces. Our model reduction method uses a ...
This paper describes an automatic methodology for optimizing sample point selection for using in the framework of model order reduction (MOR). The procedure, based on the maximiza...
This paper considers a developing theory on the effects of inevitable process variations during the fabrication of MEMS and other microsystems. The effects on the performance and ...
Shyam Praveen Vudathu, Kishore K. Duganapalli, Rai...