3738 search results - page 545 / 748 » Parametrized Logic Programming |
104
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VLSID
2009
IEEE
16 years 1 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
121
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ICCAD
2003
IEEE
15 years 9 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
106
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MTDT
2003
IEEE
15 years 5 months ago
2003
IEEE
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
119
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SAC
2002
ACM
15 years 7 days ago
2002
ACM
The theoretical price of a financial option is given by the expectation of its discounted expiry time payoff. The computation of this expectation depends on the density of the val...
95
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FASE
2010
Springer
15 years 7 months ago
2010
Springer
Multithreaded concurrent programs often exhibit bugs due to unintended interferences among the concurrent threads. Such bugs are often hard to reproduce because they typically hap...