1523 search results - page 74 / 305 » Partially ordered secretaries |
108
Voted
ATS
2005
IEEE
15 years 6 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
144
Voted
ICNP
2002
IEEE
15 years 5 months ago
2002
IEEE
— This paper describes a novel, ultra-fast heuristic algorithm to address an NP-hard optimization problem. One of its significances is that, for the first time, the paper shows...
106
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EUROPAR
2009
Springer
15 years 5 months ago
2009
Springer
The paper presents a new data partitioning algorithm for parallel computing on heterogeneous processors. Like traditional functional partitioning algorithms, the algorithm assumes ...
106
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GLVLSI
2009
IEEE
15 years 4 months ago
2009
IEEE
Design debug remains one of the major bottlenecks in the VLSI design cycle today. Existing automated solutions strive to aid engineers in reducing the debug effort by identifying ...
102
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AAAI
2010
15 years 2 months ago
2010
Relational Markov Decision Processes (MDP) are a useraction for stochastic planning problems since one can develop abstract solutions for them that are independent of domain size ...