System design complexity is growing rapidly. As a result, current development costs are constantly increasing. It is becoming increasingly difficult to estimate how much time it ...
Cyrus Bazeghi, Francisco J. Mesa-Martinez, Brian G...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
This paper considers the problem of partitioning a circuit into a collection of subcircuits, such that each subcircuit is feasible for some device from an FPGA library, and the to...
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
Abstract--The use of "turbo codes" has been proposed for several applications, including the development of wireless systems, where highly reliable transmission is requir...
Guido Masera, M. Mazza, Gianluca Piccinini, F. Vig...