29 search results - page 3 / 6 » Path delay test compaction with process variation tolerance |
GLVLSI
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
VTS
2008
IEEE
14 years 22 days ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
ISCA
2008
IEEE
14 years 23 days ago
2008
IEEE
Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introd...
ICCAD
2008
IEEE
14 years 3 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...