1241 search results - page 146 / 249 » Path-oriented random testing |
ASPDAC
2006
ACM
15 years 8 months ago
2006
ACM
Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing met...
92
Voted
DATE
2005
IEEE
15 years 8 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
126
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ICDAR
2005
IEEE
15 years 8 months ago
2005
IEEE
A spanned cell in a table is a single, complete unit that physically occupies multiple columns and/or multiple rows. Spanned cells are common in tables, and they are a significan...
127
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ICDM
2005
IEEE
15 years 8 months ago
2005
IEEE
An outlier is an observation that deviates so much from other observations as to arouse suspicion that it was generated by a different mechanism. Outlier detection has many applic...
106
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ICRA
2005
IEEE
15 years 8 months ago
2005
IEEE
Abstract— This paper introduces a novel approach to representing and learning tool affordances by a robot. The tool representation described here uses a behavior-based approach t...