1241 search results - page 172 / 249 » Path-oriented random testing |
DAC
2007
ACM
16 years 27 days ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2005
ACM
16 years 26 days ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
ICSE
2009
IEEE-ACM
16 years 21 days ago
2009
IEEE-ACM
We present a new automated white box fuzzing technique and a tool, BuzzFuzz, that implements this technique. Unlike standard fuzzing techniques, which randomly change parts of the...
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CIDM
2009
IEEE
15 years 6 months ago
2009
IEEE
— Both theory and a wealth of empirical studies have established that ensembles are more accurate than single predictive models. Unfortunately, the problem of how to maximize ens...
CLEAR
2007
Springer
15 years 6 months ago
2007
Springer
The paper describes the IBM systems submitted to the NIST Rich Transcription 2007 (RT07) evaluation campaign for the speechto-text (STT) and speaker-attributed speech-to-text (SAST...