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VLSID
1999
IEEE
103views VLSI» more  VLSID 1999»
15 years 4 months ago
POWERTEST: A Tool for Energy Conscious Weighted Random Pattern Testing
Xiaodong Zhang, Kaushik Roy, Sudipta Bhawmik
ITC
1991
IEEE
92views Hardware» more  ITC 1991»
15 years 3 months ago
Refined Bounds on Signature Analysis Aliasing for Random Testing
Nirmal R. Saxena, Piero Franco, Edward J. McCluske...