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DAC
2005
ACM
16 years 21 days ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
ICST
2008
IEEE
15 years 6 months ago
Model-Based Tests for Access Control Policies
We present a model-based approach to testing access control requirements. By using combinatorial testing, we first automatically generate test cases from and without access contro...
Alexander Pretschner, Tejeddine Mouelhi, Yves Le T...
CP
2000
Springer
15 years 4 months ago
Analysis of Random Noise and Random Walk Algorithms
Random Noise and Random Walk algorithms are local search strategies that have been used for the problem of satisfiability testing (SAT). We present a Markov-chain based analysis o...
Bhaskar Krishnamachari, Xi Xie, Bart Selman, Steph...
ICECCS
2002
IEEE
85views Hardware» more  ICECCS 2002»
15 years 4 months ago
Fault Detection Effectiveness of Spathic Test Data
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
Jane Huffman Hayes, Pifu Zhang
CIKM
2007
Springer
15 years 3 months ago
A comparison of statistical significance tests for information retrieval evaluation
Information retrieval (IR) researchers commonly use three tests of statistical significance: the Student's paired t-test, the Wilcoxon signed rank test, and the sign test. Ot...
Mark D. Smucker, James Allan, Ben Carterette