1241 search results - page 29 / 249 » Path-oriented random testing |
ACSD
2003
IEEE
15 years 3 months ago
2003
IEEE
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously prese...
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STOC
2004
ACM
16 years 1 days ago
2004
ACM
The main result of this paper is a near-optimal derandomization of the affine homomorphism test of Blum, Luby and Rubinfeld (Journal of Computer and System Sciences, 1993). We sho...
DATE
1997
IEEE
15 years 4 months ago
1997
IEEE
Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC'94. This is an ...
VLSID
2002
IEEE
16 years 4 days ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
ICALP
2005
Springer
15 years 5 months ago
2005
Springer
We consider the problem of testing the commutativity of a black-box group specified by its k generators. The complexity (in terms of k) of this problem was first considered by Pa...