1241 search results - page 30 / 249 » Path-oriented random testing |
100
click to vote
DSD
2007
IEEE
15 years 6 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
DPHOTO
2010
15 years 1 months ago
2010
Conventional point spread function (PSF) measurement methods often use parametric models for the estimation of the PSF. This limits the shape of the PSF to a specific form provide...
QSIC
2009
IEEE
15 years 6 months ago
2009
IEEE
—A web service may evolve autonomously, making peer web services in the same service composition uncertain as to whether the evolved behaviors may still be compatible to its orig...
129
click to vote
ICST
2008
IEEE
15 years 6 months ago
2008
IEEE
Web applications have rapidly become a critical part of business for many organizations. However, increased usage of web applications has not been reciprocated with corresponding ...
VTS
2008
IEEE
15 years 6 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...