1241 search results - page 32 / 249 » Path-oriented random testing |
FOCS
2004
IEEE
15 years 3 months ago
2004
IEEE
We present an efficient randomized algorithm to test if a given function f : Fn p Fp (where p is a prime) is a low-degree polynomial. This gives a local test for Generalized Reed...
CC
2008
Springer
14 years 12 months ago
2008
Springer
There exists a positive constant < 1 such that for any function T(n) n and for any problem L BPTIME(T(n)), there exists a deterministic algorithm running in poly(T(n)) time w...
118
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ITC
1994
IEEE
15 years 3 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
114
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ICST
2010
IEEE
14 years 9 months ago
2010
IEEE
Mobile computing systems provide new challenges for verification. One of them is the dynamicity of the system structure, with mobility-induced connections and disconnections, dynam...
IFIP
2001
Springer
15 years 4 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...