1241 search results - page 35 / 249 » Path-oriented random testing |
CCE
2004
14 years 11 months ago
2004
The results of experimental testing of balanced random interval arithmetic with typical mathematical test functions and practical problem are presented and discussed. The possibili...
ITC
1995
IEEE
15 years 3 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
108
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KDD
2006
ACM
16 years 5 days ago
2006
ACM
The problem of assessing the significance of data mining results on high-dimensional 0?1 data sets has been studied extensively in the literature. For problems such as mining freq...
ACSC
2004
IEEE
15 years 3 months ago
2004
IEEE
The collision test is an important statistical test for rejecting poor random number generators. The test simulates the throwing of balls randomly into urns. A problem in applying...
102
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ATS
2000
IEEE
15 years 4 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...