1241 search results - page 3 / 249 » Path-oriented random testing |
TODAES
1998
14 years 11 months ago
1998
108
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COMPSAC
2010
IEEE
14 years 9 months ago
2010
IEEE
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...
103
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PTS
2010
14 years 10 months ago
2010
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
VLSID
2004
IEEE
16 years 1 hour ago
2004
IEEE
JSA
2000
14 years 11 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...