1241 search results - page 3 / 249 » Path-oriented random testing |
TODAES
1998
13 years 5 months ago
1998
COMPSAC
2010
IEEE
13 years 4 months ago
2010
IEEE
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...
PTS
2010
13 years 4 months ago
2010
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
VLSID
2004
IEEE
14 years 6 months ago
2004
IEEE
JSA
2000
13 years 6 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...