1241 search results - page 50 / 249 » Path-oriented random testing |
164
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ITC
1997
IEEE
15 years 6 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ATS
2009
IEEE
15 years 9 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
VTS
2000
IEEE
15 years 6 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
112
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SOUPS
2009
ACM
15 years 8 months ago
2009
ACM
Randomness is a necessary ingredient in various computational tasks and especially in Cryptography, yet many existing mechanisms for obtaining randomness suffer from numerous pro...
107
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LOGCOM
2007
15 years 2 months ago
2007
We investigate notions of randomness in the space C[2N ] of nonempty closed subsets of {0, 1}N . A probability measure is given and a version of the Martin-L¨of test for randomne...