1241 search results - page 59 / 249 » Path-oriented random testing |
104
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CVPR
2007
IEEE
16 years 4 months ago
2007
IEEE
This paper proposes a statistical approach to degraded handwritten form image preprocessing including binarization and form line removal. The degraded image is modeled by a Markov...
96
Voted
ICPR
2008
IEEE
16 years 3 months ago
2008
IEEE
Ensemble of Classifiers (EoC) has been shown effective in improving the performance of single classifiers by combining their outputs. By using diverse data subsets to train classi...
115
Voted
IJCNN
2007
IEEE
15 years 8 months ago
2007
IEEE
—The 0/1 loss is an important cost function for perceptrons. Nevertheless it cannot be easily minimized by most existing perceptron learning algorithms. In this paper, we propose...
110
Voted
DAC
1997
ACM
15 years 6 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
114
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AAAI
2007
15 years 4 months ago
2007
In recent years, the size of combinatorial applications and the need to produce high-quality solutions quickly have increased steadily, providing significant challenges for optim...