1241 search results - page 74 / 249 » Path-oriented random testing |
142
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
127
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ERLANG
2008
ACM
15 years 6 months ago
2008
ACM
When creating software, data types are the basic bricks. Most of the time a programmer will use data types defined in library modules, therefore being tested by many users over ma...
114
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CSDA
2006
15 years 4 months ago
2006
The comparison of the accuracy of two binary diagnostic tests has traditionally required knowledge of the real state of the disease in all of the patients in the sample via the ap...
154
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JUCS
2006
15 years 4 months ago
2006
Abstract: Combinatorial property testing, initiated formally by Goldreich, Goldwasser, and Ron in [Goldreich et al. (1998)] and inspired by Rubinfeld and Sudan in [Rubinfeld and Su...
124
Voted
ICCD
2004
IEEE
16 years 1 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...