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ICCAD
1991
IEEE
135views Hardware» more  ICCAD 1991»
15 years 1 months ago
DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
Torsten Grüning, Udo Mahlstedt, Hartmut Koopm...
ICIP
2003
IEEE
15 years 11 months ago
Incorporating constraints into the design of locally identifiable calibration patterns
Camera calibration requires the identification of points in an image that correspond to known locations in the scene. These are typically determined through the use of a calibrati...
Anton van den Hengel, Rhys Hill, Michael J. Brooks
70
Voted
ICCAD
1998
IEEE
122views Hardware» more  ICCAD 1998»
15 years 1 months ago
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
Vamsi Boppana, W. Kent Fuchs
IJAR
2006
92views more  IJAR 2006»
14 years 9 months ago
Possibilistic clustering approach to trackless ring Pattern Recognition in RICH counters
The pattern recognition problem in Ring Imaging CHerenkov (RICH) counters concerns the identification of an unknown number of rings whose centers and radii are assumed to be unkno...
A. M. Massone, Léonard Studer, Francesco Ma...
100
Voted
FSKD
2005
Springer
267views Fuzzy Logic» more  FSKD 2005»
15 years 3 months ago
Preventing Meaningless Stock Time Series Pattern Discovery by Changing Perceptually Important Point Detection
Discovery of interesting or frequently appearing time series patterns is one of the important tasks in various time series data mining applications. However, recent research critic...
Tak-Chung Fu, Fu-Lai Chung, Robert W. P. Luk, Chak...