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576views
16 years 11 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CVPR
2007
IEEE
16 years 1 months ago
Quality-Driven Face Occlusion Detection and Recovery
This paper presents a framework to automatically detect and recover the occluded facial region. We first derive a Bayesian formulation unifying the occlusion detection and recover...
Dahua Lin, Xiaoou Tang
ICIP
2006
IEEE
16 years 1 months ago
Virtual Craniofacial Reconstruction from Computed Tomography Image Sequences Exhibiting Multiple Fractures
A novel procedure for in-silico (virtual) craniofacial reconstruction of human mandibles with multiple fractures from a sequence of Computed Tomography (CT) images is presented. T...
Ananda S. Chowdhury, Suchendra M. Bhandarkar, Robe...
KDD
2004
ACM
170views Data Mining» more  KDD 2004»
16 years 2 days ago
Why collective inference improves relational classification
Procedures for collective inference make simultaneous statistical judgments about the same variables for a set of related data instances. For example, collective inference could b...
David Jensen, Jennifer Neville, Brian Gallagher
LATA
2009
Springer
15 years 6 months ago
Rigid Tree Automata
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a rest...
Florent Jacquemard, Francis Klay, Camille Vacher