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576views
17 years 4 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CVPR
2007
IEEE
16 years 7 months ago
Quality-Driven Face Occlusion Detection and Recovery
This paper presents a framework to automatically detect and recover the occluded facial region. We first derive a Bayesian formulation unifying the occlusion detection and recover...
Dahua Lin, Xiaoou Tang
150
Voted
ICIP
2006
IEEE
16 years 6 months ago
Virtual Craniofacial Reconstruction from Computed Tomography Image Sequences Exhibiting Multiple Fractures
A novel procedure for in-silico (virtual) craniofacial reconstruction of human mandibles with multiple fractures from a sequence of Computed Tomography (CT) images is presented. T...
Ananda S. Chowdhury, Suchendra M. Bhandarkar, Robe...
KDD
2004
ACM
170views Data Mining» more  KDD 2004»
16 years 5 months ago
Why collective inference improves relational classification
Procedures for collective inference make simultaneous statistical judgments about the same variables for a set of related data instances. For example, collective inference could b...
David Jensen, Jennifer Neville, Brian Gallagher
164
Voted
LATA
2009
Springer
15 years 12 months ago
Rigid Tree Automata
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a rest...
Florent Jacquemard, Francis Klay, Camille Vacher