35 search results - page 4 / 7 » Pattern generation for a deterministic BIST scheme |
161
click to vote
DSD
2007
IEEE
15 years 12 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
132
click to vote
DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
128
Voted
VTS
2005
IEEE
15 years 11 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
149
click to vote
DDECS
2006
IEEE
15 years 11 months ago
2006
IEEE
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...
148
click to vote
VTS
2000
IEEE
15 years 10 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...