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» Pattern-Constrained Test Case Generation
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102
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FATES
2004
Springer
15 years 8 months ago
Symbolic Test Case Generation for Primitive Recursive Functions
Achim D. Brucker, Burkhart Wolff
87
Voted
KBSE
2003
IEEE
15 years 8 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...
97
Voted
ICSE
2009
IEEE-ACM
15 years 7 months ago
The Automated Generation of Test Cases Using an Extended Domain Based Reliability Model
Alberto Avritzer, Elaine J. Weyuker
99
Voted
FM
2001
Springer
101views Formal Methods» more  FM 2001»
15 years 7 months ago
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
Laurent Arditi, Hédi Boufaïed, Arnaud ...
65
Voted
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 7 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha