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» Pattern-Constrained Test Case Generation
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KBSE
2003
IEEE
15 years 8 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 7 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha