758 search results - page 31 / 152 » Pattern-Constrained Test Case Generation |
82
Voted
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
TAICPART
2006
IEEE
15 years 3 months ago
2006
IEEE
Testing compositions of web services is complex, due to their distributed nature and asynchronous behaviour. However, research in this field is scarce. We propose a new testing me...
108
Voted
JAVACARD
2000
15 years 1 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
72
Voted
GECCO
2007
Springer
15 years 3 months ago
2007
Springer
There has been a considerable body of work on search–based test data generation for branch coverage. However, hitherto, there has been no work on multi–objective branch covera...
ASPLOS
2012
ACM
13 years 5 months ago
2012
ACM
Processor emulators are widely used to provide isolation and instrumentation of binary software. However they have proved difficult to implement correctly: processor specificati...