758 search results - page 76 / 152 » Pattern-Constrained Test Case Generation |
110
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ICSE
2005
IEEE-ACM
15 years 12 months ago
2005
IEEE-ACM
We present an automatic error-detection approach that combines static checking and concrete test-case generation. Our approach consists of taking the abstract error conditions inf...
FATES
2003
Springer
15 years 5 months ago
2003
Springer
Most efforts to combine formal methods and software testing go in the direction of exploiting formal methods to solve testing problems, most commonly test case generation. Here we ...
FORTE
1998
15 years 1 months ago
1998
In a testing environment, where an IUT communicates with multiple entities, a tester may have di ering degrees of controllability on the interactions between these entities and th...
RE
2004
Springer
15 years 5 months ago
2004
Springer
Most problems in building and refining a system can be traced back to errors in requirements. Poorly organized requirements, most often in natural language are among the major ca...
114
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ATS
2000
IEEE
15 years 4 months ago
2000
IEEE
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...