758 search results - page 81 / 152 » Pattern-Constrained Test Case Generation |
DATE
2002
IEEE
15 years 4 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
Abstract— This paper discusses the generation of informationrich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of ...
100
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TVLSI
2008
14 years 11 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ISSRE
2003
IEEE
15 years 5 months ago
2003
IEEE
Software testing and software fault tolerance are two major techniques for developing reliable software systems, yet limited empirical data are available in the literature to eval...
127
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ISSRE
2003
IEEE
15 years 5 months ago
2003
IEEE
Component based software development is prone to unexpected interaction faults. The goal is to test as many potential interactions as is feasible within time and budget constraint...