758 search results - page 88 / 152 » Pattern-Constrained Test Case Generation |
122
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SP
2006
IEEE
15 years 5 months ago
2006
IEEE
Many current systems allow data produced by potentially malicious sources to be mounted as a file system. File system code must check this data for dangerous values or invariant ...
ICCAD
1999
IEEE
15 years 4 months ago
1999
IEEE
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
103
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TOOLS
2000
IEEE
15 years 4 months ago
2000
IEEE
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
DATE
2003
IEEE
15 years 5 months ago
2003
IEEE
Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature A...
101
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PADS
2006
ACM
15 years 5 months ago
2006
ACM
In this paper we present a detailed analysis of the performance of the Decision Theoretic Read Delay (DTRD) optimistic synchronisation algorithm for simulations of Multistems. We ...