758 search results - page 90 / 152 » Pattern-Constrained Test Case Generation |
125
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ATS
2002
IEEE
15 years 4 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
GECCO
2000
Springer
15 years 3 months ago
2000
Springer
In earlier work we predicted program size would grow in the limit at a quadratic rate and up to fty generations we measured bloat O(generations1:2;1:5). On two simple benchmarks w...
112
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ISSRE
2000
IEEE
15 years 4 months ago
2000
IEEE
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
81
Voted
HICSS
2005
IEEE
15 years 5 months ago
2005
IEEE
Nicholas Carr’s question “Does IT Matter?”(to the maintenance of competitive advantage) has been applied to many industries but the one that depends on IT almost exclusively...
120
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CCGRID
2010
IEEE
14 years 3 months ago
2010
IEEE
- Scientific workflows have become an integral part of cyberinfrastructure as their computational complexity and data sizes have grown. However, the complexity of the distributed i...