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» Patterns: from system design to software testing
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DFT
2003
IEEE
64views VLSI» more  DFT 2003»
15 years 3 months ago
Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, ...
KBSE
2010
IEEE
14 years 8 months ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang
IOLTS
2008
IEEE
117views Hardware» more  IOLTS 2008»
15 years 4 months ago
Verification and Analysis of Self-Checking Properties through ATPG
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Marc Hunger, Sybille Hellebrand
ICSEA
2007
IEEE
15 years 4 months ago
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
Gordon Fraser, Franz Wotawa
FAABS
2000
Springer
15 years 1 months ago
From Livingstone to SMV
To ful ll the needs of its deep space exploration program, NASAis actively supporting research and development in autonomy software. However, the reliable and cost-e ective develop...
Charles Pecheur, Reid G. Simmons