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    SAC
    2004
    ACM
    108views Applied Computing» more  SAC 2004»
    SQL based frequent pattern mining without candidate generation
    15 years 8 months ago
    SQL based frequent pattern mining without candidate generation
    Download  wwwiti.cs.uni-magdeburg.de
    Xuequn Shang, Kai-Uwe Sattler, Ingolf Geist
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    DATE
    2003
    IEEE
    62views Hardware» more  DATE 2003»
    RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
    15 years 8 months ago
    RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
    Download  www.date-conference.com
    Marcelino B. Santos, José M. Fernandes, Isa...
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    ATS
    2000
    IEEE
    86views Hardware» more  ATS 2000»
    An adjacency-based test pattern generator for low power BIST design
    15 years 7 months ago
    An adjacency-based test pattern generator for low power BIST design
    Download  dit.upc.es
    Patrick Girard, Loïs Guiller, Christian Landr...
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    APSEC
    1999
    IEEE
    105views Software Engineering» more  APSEC 1999»
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
    15 years 7 months ago
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
    Download  www.scarpaz.com
    Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida
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    ATS
    1998
    IEEE
    106views Hardware» more  ATS 1998»
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    15 years 7 months ago
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    Download  www.cad.polito.it
    This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
    Silvia Chiusano, Fulvio Corno, Paolo Prinetto
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