- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
In very deep-submicron VLSI, certain manufacturing steps – notably optical exposure, resist development and etch, chemical vapor deposition and chemical-mechanical polishing (CM...
Andrew B. Kahng, Gabriel Robins, Anish Singh, Huij...
We present a framework to analyze color documents of complex layout. In addition, no assumption is made on the layout. Our framework combines in a content-driven bottom-up approac...
The memory subsystem is a major contributor to the performance, power, and area of complex SoCs used in feature rich multimedia products. Hence, memory architecture of the embedded...
T. S. Rajesh Kumar, C. P. Ravikumar, R. Govindaraj...
In preemptive real-time systems, a tighter estimate of the Worst Case Response Time(WCRT) of the tasks can be obtained if the layout of the tasks in memory is included in the esti...