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16 years 9 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
IJCNN
2008
IEEE
15 years 4 months ago
Learning adaptive subject-independent P300 models for EEG-based brain-computer interfaces
Abstract— This paper proposes an approach to learn subjectindependent P300 models for EEG-based brain-computer interfaces. The P300 models are first learned using a pool of exis...
Shijian Lu, Cuntai Guan, Haihong Zhang
TWC
2008
119views more  TWC 2008»
14 years 10 months ago
Flow-level performance of opportunistic OFDM-TDMA and OFDMA networks
Abstract--In this paper, the flow-level performance of opportunistic scheduling in orthogonal frequency division multiplexing (OFDM) networks is studied. The analysis accounts for ...
Lei Lei, Chuang Lin, Jun Cai, Xuemin Shen
AAAI
2007
15 years 14 days ago
Learning Large Scale Common Sense Models of Everyday Life
Recent work has shown promise in using large, publicly available, hand-contributed commonsense databases as joint models that can be used to infer human state from day-to-day sens...
William Pentney, Matthai Philipose, Jeff A. Bilmes...
SC
2009
ACM
15 years 2 months ago
A framework for core-level modeling and design of reconfigurable computing algorithms
Reconfigurable computing (RC) is rapidly becoming a vital technology for many applications, from high-performance computing to embedded systems. The inherent advantages of custom-...
Gongyu Wang, Greg Stitt, Herman Lam, Alan D. Georg...