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ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
16 years 1 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
ICCAD
2002
IEEE
157views Hardware» more  ICCAD 2002»
16 years 1 months ago
Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads
Dynamic voltage scaling (DVS) reduces the power consumption of processors when peak performance is unnecessary. However, the achievable power savings by DVS alone is becoming limi...
Steven M. Martin, Krisztián Flautner, Trevo...
ICCAD
2001
IEEE
127views Hardware» more  ICCAD 2001»
16 years 1 months ago
What is the Limit of Energy Saving by Dynamic Voltage Scaling?
Dynamic voltage scaling (DVS) is a technique that varies the supply voltage and clock frequency based on the computation load to provide desired performance with the minimal amoun...
Gang Qu
ISQED
2009
IEEE
126views Hardware» more  ISQED 2009»
15 years 11 months ago
Robust differential asynchronous nanoelectronic circuits
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Bao Liu
CSE
2009
IEEE
15 years 11 months ago
A Network-Aware Distributed Membership Protocol for Collaborative Defense
— To counteract current trends in network malware, distributed solutions have been developed that harness the power of collaborative end-host sensors. While these systems greatly...
David Zage, Carl Livadas, Eve M. Schooler