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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2010
ACM
15 years 6 months ago
Instruction cache locking using temporal reuse profile
The performance of most embedded systems is critically dependent on the average memory access latency. Improving the cache hit rate can have significant positive impact on the per...
Yun Liang, Tulika Mitra
DSRT
2006
IEEE
16 years 5 days ago
Grid-enabling FIRST: Speeding Up Simulation Applications Using WinGrid
The vision of grid computing is to make computational power, storage capacity, data and applications available to users as readily as electricity and other utilities. Grid infrast...
Navonil Mustafee, Anders Alstad, Bjorn Larsen, Sim...
MIDDLEWARE
2009
Springer
15 years 10 months ago
Automatic Stress Testing of Multi-tier Systems by Dynamic Bottleneck Switch Generation
Abstract. The performance of multi-tier systems is known to be significantly degraded by workloads that place bursty service demands on system resources. Burstiness can cause queu...
Giuliano Casale, Amir Kalbasi, Diwakar Krishnamurt...
AUSAI
2006
Springer
15 years 9 months ago
Robust Character Recognition Using a Hierarchical Bayesian Network
There is increasing evidence to suggest that the neocortex of the mammalian brain does not consist of a collection of specialised and dedicated cortical architectures, but instead ...
John Thornton, Torbjorn Gustafsson, Michael Blumen...
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