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70
Voted
DATE
1998
IEEE
15 years 5 months ago
1998
IEEE
We propose a new approach to RT-level power modeling for combinationalmacros, that does not require simulationbased characterization. A pattern-dependent power model for a macro i...
94
Voted
ICCD
2001
IEEE
15 years 9 months ago
2001
IEEE
As the operating frequency increases to Giga Hertz and the rise time of a signal is less than or comparable to the time-of-flight delay of a line, it is necessary to consider the...
GLOBECOM
2009
IEEE
14 years 10 months ago
2009
IEEE
Performance modeling is important for the purpose of developing efficient dimensioning tools for large complicated networks. But it is difficult to achieve in heterogeneous wireles...
112
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ET
2007
15 years 21 days ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
112
Voted
ASPDAC
2007
ACM
15 years 4 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...