4110 search results - page 181 / 822 » Performance modeling using Monte Carlo simulation |
145
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ICCAD
2009
IEEE
15 years 1 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
131
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
135
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ISPD
2005
ACM
15 years 9 months ago
2005
ACM
In the nanometer VLSI technology, the variation effects like manufacturing variation, power supply noise, temperature etc. become very significant. As one of the most vital nets...
155
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3DPVT
2006
IEEE
15 years 7 months ago
2006
IEEE
We present a novel method for detecting and quantifying 3D structure in stacks of microscopic images captured at incremental focal lengths. We express the image data as stochastic...
110
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WSC
2000
15 years 5 months ago
2000
A simulation model was developed and tested using Taylor II to justify the implementation of a Flexible Manufacturing Cell (FMC). The current production capacity at the existing C...