4110 search results - page 8 / 822 » Performance modeling using Monte Carlo simulation |
ASPDAC
2007
ACM
15 years 3 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
105
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DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Single-electron devices have drawn much attention in the last two decades. They have been widely used for device research and also show promise as a potential alternative to compl...
LSSC
2001
Springer
15 years 4 months ago
2001
Springer
The problen of the backscattering of electrons from metal targets is subject of extensive theoreticel and experimental work in surface analysis. We are interested in the angular di...
120
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WSC
1997
15 years 29 days ago
1997
In this paper we compare the average performance of Monte Carlo methods for global optimization with non-adaptive deterministic alternatives. We analyze the behavior of the algori...
105
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IJCV
2008
14 years 11 months ago
2008
The recent development of Sequential Monte Carlo methods (also called particle filters) has enabled the definition of efficient algorithms for tracking applications in image sequen...