Power-related issues have become important considerations in current generation microprocessor design. One of these issues is that of elevated on-chip temperatures. This has an ad...
The assessment of the changeability of software systems is of major concern for buyers of the large systems found in fast-moving domains such as telecommunications. One way of app...
M. Ajmal Chaumun, Hind Kabaili, Rudolf K. Keller, ...
Agile methodologies employ light-weight development practices emphasizing a test-driven approach to the development of software systems. Modern agile development environments supp...
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
Tim Menzies, Justin S. Di Stefano, Kareem Ammar, K...
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...