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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 9 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
180
Voted
WER
2004
Springer
15 years 10 months ago
Enhancing Requirements to derive Multi-Agent Architectures
Software systems of today are characterized by the increasing size, complexity, distribution and heterogeneity. Understanding and supporting the interaction between software requir...
Lúcia R. D. Bastos, Jaelson Brelaz de Castr...
SOFSEM
2007
Springer
15 years 11 months ago
Creating Permanent Test Collections of Web Pages for Information Extraction Research
In the research area of automatic web information extraction, there is a need for permanent and annotated web page collections enabling objective performance evaluation of differen...
Bernhard Pollak, Wolfgang Gatterbauer
ASPDAC
1998
ACM
105views Hardware» more  ASPDAC 1998»
15 years 9 months ago
Techniques for Functional Test Pattern Execution
Functional debugging often dominates the time and cost of the ASIC system development, mainly due to the limited controllability and observability of the storage elements in desig...
Inki Hong, Miodrag Potkonjak
WOSP
2000
ACM
15 years 9 months ago
Quantitative system evaluation with DSPNexpress 2000
This paper describes the software package DSPNexpress 2000, a tool for the quantitative evaluation of systems specified in stochastic Petri nets, the Unified Modeling Language (UM...
Christoph Lindemann, Axel Thümmler, Alexander...