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DAC
2006
ACM
15 years 10 months ago
Prototyping a fault-tolerant multiprocessor SoC with run-time fault recovery
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
Xinping Zhu, Wei Qin
DAC
2003
ACM
15 years 10 months ago
Learning from BDDs in SAT-based bounded model checking
Bounded Model Checking (BMC) based on Boolean Satisfiability (SAT) procedures has recently gained popularity as an alternative to BDD-based model checking techniques for finding b...
Aarti Gupta, Malay K. Ganai, Chao Wang, Zijiang Ya...
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DAC
2006
ACM
15 years 10 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
DAC
1994
ACM
15 years 1 months ago
The Design of High-Performance Microprocessors at Digital
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...
Thomas F. Fox
DAC
2005
ACM
14 years 11 months ago
A design platform for 90-nm leakage reduction techniques
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
Philippe Royannez, Hugh Mair, Franck Dahan, Mike W...