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» Post-Layout Optimization for Deep Submicron Design
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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
15 years 3 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
ICCAD
1999
IEEE
97views Hardware» more  ICCAD 1999»
15 years 1 months ago
A methodology for correct-by-construction latency insensitive design
In Deep Sub-Micron (DSM) designs, performance will depend critically on the latency of long wires. We propose a new synthesis methodology for synchronous systems that makes the de...
Luca P. Carloni, Kenneth L. McMillan, Alexander Sa...
DAC
2003
ACM
15 years 10 months ago
Multilevel global placement with retiming
Multiple clock cycles are needed to cross the global interconnects for multi-gigahertz designs in nanometer technologies. For synchronous designs, this requires retiming and pipel...
Jason Cong, Xin Yuan
ICCAD
2002
IEEE
113views Hardware» more  ICCAD 2002»
15 years 6 months ago
Interconnect-aware high-level synthesis for low power
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
Lin Zhong, Niraj K. Jha
ICCAD
2001
IEEE
100views Hardware» more  ICCAD 2001»
15 years 6 months ago
Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Kaustav Banerjee, Amit Mehrotra