1419 search results - page 141 / 284 » Power Droop Testing |
129
Voted
DELTA
2006
IEEE
15 years 9 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
103
Voted
DSD
2006
IEEE
15 years 9 months ago
2006
IEEE
Modern day applications require use of multi-processor systems for reasons of scalability and power efficiency. As more and more applications are integrated on a single device, m...
128
Voted
ECRTS
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper investigates real-time scheduling in a system whose energy reservoir is replenished by an environmental power source. The execution of tasks is deemed primarily energy-...
170
Voted
MTDT
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper highlights the cell current characterization of a low leakage 6T SRAM by adjusting the threshold voltages of the transistors in the memory array to reduce the standby p...
127
Voted
GLVLSI
2005
IEEE
15 years 9 months ago
2005
IEEE
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...