1419 search results - page 194 / 284 » Power Droop Testing |
148
Voted
DILS
2009
Springer
15 years 10 months ago
2009
Springer
Probabilistic functional integrated networks are powerful tools with which to draw inferences from high-throughput data. However, network analyses are generally not tailored to spe...
147
Voted
SBCCI
2009
ACM
15 years 10 months ago
2009
ACM
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
119
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CISS
2008
IEEE
15 years 10 months ago
2008
IEEE
We survey our work on adaptive multiresolution (MR) approaches to the classification of biological images. The system adds MR decomposition in front of a generic classifier cons...
106
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
128
Voted
GLVLSI
2008
IEEE
15 years 10 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...