1419 search results - page 194 / 284 » Power Droop Testing |
171
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DILS
2009
Springer
16 years 3 days ago
2009
Springer
Probabilistic functional integrated networks are powerful tools with which to draw inferences from high-throughput data. However, network analyses are generally not tailored to spe...
168
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SBCCI
2009
ACM
16 years 1 days ago
2009
ACM
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
150
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CISS
2008
IEEE
16 years 9 hour ago
2008
IEEE
We survey our work on adaptive multiresolution (MR) approaches to the classification of biological images. The system adds MR decomposition in front of a generic classifier cons...
130
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DATE
2008
IEEE
16 years 4 hour ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
157
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GLVLSI
2008
IEEE
15 years 12 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...